<?xml version="1.0" encoding="utf-8" ?> <rss version="2.0" xmlns:opensearch="http://a9.com/-/spec/opensearch/1.1/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:atom="http://www.w3.org/2005/Atom"> <channel> <title> <![CDATA[BEC, Bagalkot Search for 'su:&quot;Design For Manufacturability And Yield For Nano-Scale Cmos&quot;']]> </title> <!-- prettier-ignore-start --> <link> http://119.161.97.235//cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22Design%20For%20Manufacturability%20And%20Yield%20For%20Nano-Scale%20Cmos%22&#38;sort_by=relevance&#38;format=rss </link> <!-- prettier-ignore-end --> <atom:link rel="self" type="application/rss+xml" href="http://119.161.97.235//cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22Design%20For%20Manufacturability%20And%20Yield%20For%20Nano-Scale%20Cmos%22&#38;sort_by=relevance&#38;format=rss" /> <description> <![CDATA[ Search results for 'su:&quot;Design For Manufacturability And Yield For Nano-Scale Cmos&quot;' at BEC, Bagalkot]]> </description> <opensearch:totalResults>2</opensearch:totalResults> <opensearch:startIndex>0</opensearch:startIndex> <opensearch:itemsPerPage>50</opensearch:itemsPerPage> <atom:link rel="search" type="application/opensearchdescription+xml" href="http://119.161.97.235//cgi-bin/koha/opac-search.pl?q=ccl=su%3A%22Design%20For%20Manufacturability%20And%20Yield%20For%20Nano-Scale%20Cmos%22&#38;sort_by=relevance&#38;format=opensearchdescription" /> <opensearch:Query role="request" searchTerms="q%3Dccl%3Dsu%253A%2522Design%2520For%2520Manufacturability%2520And%2520Yield%2520For%2520Nano-Scale%2520Cmos%2522" startPage="" /> <item> <title> Design for Manufacturability and Yield for Nano-Scale CMOS </title> <dc:identifier>ISBN:9781402051883</dc:identifier> <!-- prettier-ignore-start --> <link>http://119.161.97.235//cgi-bin/koha/opac-detail.pl?biblionumber=67130</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1402051883.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Charles C. Chiang, Jamil Kawa.<br /> Germany Springer 2014 9781402051883 </p> ]]> <![CDATA[ <p> <a href="http://119.161.97.235//cgi-bin/koha/opac-reserve.pl?biblionumber=67130">Place hold on <em>Design for Manufacturability and Yield for Nano-Scale CMOS</em></a> </p> ]]> </description> <guid>http://119.161.97.235//cgi-bin/koha/opac-detail.pl?biblionumber=67130</guid> </item> <item> <title> Design For Manufacturability And Yield For Nano-Scale Cmos </title> <dc:identifier>ISBN:9781402051876</dc:identifier> <!-- prettier-ignore-start --> <link>http://119.161.97.235//cgi-bin/koha/opac-detail.pl?biblionumber=91180</link> <!-- prettier-ignore-end --> <description> <![CDATA[ <img src="https://images-na.ssl-images-amazon.com/images/P/1402051875.01.TZZZZZZZ.jpg" alt="" /> ]]> <![CDATA[ <p> By Chiang C..<br /> Germany Springer 2017 9781402051876 </p> ]]> <![CDATA[ <p> <a href="http://119.161.97.235//cgi-bin/koha/opac-reserve.pl?biblionumber=91180">Place hold on <em>Design For Manufacturability And Yield For Nano-Scale Cmos</em></a> </p> ]]> </description> <guid>http://119.161.97.235//cgi-bin/koha/opac-detail.pl?biblionumber=91180</guid> </item> </channel> </rss>
