Power Constained Testing of VLSI Circuits
Nicola Nicolici
Power Constained Testing of VLSI Circuits - Boston Kluwer 2003
0000052478
Constained
Power
Testing
VLSI
Circuits
Electronic Devices & Circuits(621.381042)
621.381042
Power Constained Testing of VLSI Circuits - Boston Kluwer 2003
0000052478
Constained
Power
Testing
VLSI
Circuits
Electronic Devices & Circuits(621.381042)
621.381042
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