Defect Oriented Testing for Nano Metric CMOS VLSI Circuits,Ed2

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Material type: Text

TextPublication details: New Delhi Springer 2007Edition: SecondISBN:

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Holdings
Item type	Current library	Collection	Call number	Status	Barcode
Main Library Books	Basaveshwar Engineering College,Bagalkote HAND_BOOKS A-39	Mechanical Engineering	621.381042 SAC (Browse shelf(Opens below))	Available	082076
Main Library Books	Basaveshwar Engineering College,Bagalkote HAND_BOOKS A-39	Mechanical Engineering	621.381042 SAC (Browse shelf(Opens below))	Available	082077
Reference	Basaveshwar Engineering College,Bagalkote REFERENCE-27	Mechanical Engineering	621.381042 SAC (Browse shelf(Opens below))	Not for loan	082078

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Previous	519.5 REN Methods of Multivariate Analysis	621 HOU Laser Beam Information Systems	621.381042 SAC Defect Oriented Testing for Nano Metric CMOS VLSI Circuits,Ed2	621.381042 SAC Defect Oriented Testing for Nano Metric CMOS VLSI Circuits,Ed2	670.285 MAD Computational Intelligence for Engineering systems

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