Nicola Nicolici <br/><br/>
Power Constained Testing of VLSI Circuits 

 - Boston  Kluwer  2003 
<br/><br/><label>ISBN: </label>0000052478 
<br/><br/><label>Subjects--Topical Terms: </label><br/> Constained <br/> Power <br/> Testing <br/> VLSI<br/>Circuits <br/>Electronic Devices & Circuits(621.381042)
<br/><br/><label>Dewey Class. No.: </label>621.381042