TY  - BOOK
AU  - Manoj Sachdev
AU  - Gyvez
TI  - Defect Oriented Testing for Nano Metric CMOS VLSI Circuits,Ed2
SN  - 0000082076
U1  - 621.381042 
PY  - 2007///
CY  - New Delhi
PB  - Springer
KW  -  CMOS
KW  -  Defect
KW  -  Detect
KW  -  Metric
KW  -  Nano
KW  -  Oriented
KW  -  Testing
KW  -  VLSI
KW  - Circuits,Ed2
KW  - Electronic Devices & Circuits(621.381042)
ER  -