Stanley L Hurst <br/><br/>
VLSI Testing 

 - UK  IEE  1998 
<br/><br/><label>ISBN: </label>0000082705 
<br/><br/><label>Subjects--Topical Terms: </label><br/> Digital <br/> Mixed <br/> Techniques <br/> Testing <br/> VLSI<br/>Analog <br/>Electronic Devices & Circuits(621.381042)
<br/><br/><label>Dewey Class. No.: </label>621.381042