Goel , Sandeep K. <br/><br/>
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits 

 - London  T&F  2014 
<br/><br/><label>ISBN: </label>9781439829424 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electrical <br/>Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits