TY  - BOOK
AU  - Goel , Sandeep K.
TI  - Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
SN  - 9781439829424
PY  - 2014///
CY  - London
PB  - T&F
KW  - Electrical
KW  - Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
UR  - https://www.taylorfrancis.com/books/9781439829424
ER  -