TY  - BOOK
AU  - Patrick S. P. Wang
TI  - Pattern Recognition, Machine Intelligence and Biometrics
SN  - 978-3-642-22407-2
PY  - 2011///
CY  - Germany
PB  - Springer
KW  - Computer Science
KW  - Pattern Recognition, Machine Intelligence and Biometrics
UR  - http://link.springer.com/openurl?genre=book&isbn=978-3-642-22406-5
ER  -