TY  - BOOK
AU  - Martin von Haartman, Mikael Östling
TI  - Low-Frequency Noise In Advanced Mos Devices
SN  - 9781402059100
PY  - 2014///
CY  - Germany
PB  - Springer
KW  - Low-Frequency Noise In Advanced Mos Devices
UR  - http://link.springer.com/book/10.1007/978-1-4020-5910-0
ER  -