TY  - BOOK
AU  - Yongke Sun, Scott E. Thompson, Toshikazu Nishida
TI  - Strain Effect in Semiconductors
SN  - 9781441905529
PY  - 2014///
CY  - Germany
PB  - Springer
KW  - Strain Effect in Semiconductors
UR  - http://link.springer.com/book/10.1007/978-1-4419-0552-9
ER  -