TY  - BOOK
AU  - Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu
TI  - Dependability in Electronic Systems
SN  - 9781441967152
PY  - 2014///
CY  - Germany
PB  - Springer
KW  - Dependability in Electronic Systems
UR  - http://link.springer.com/book/10.1007/978-1-4419-6715-2
ER  -