Ruijing Shen, Sheldon X.-D. Tan, Hao Yu <br/><br/>
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs 

 - Germany  Springer  2014 
<br/><br/><label>ISBN: </label>9781461407881 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs