TY  - BOOK
AU  - Xiao Liu, Qiang Xu
TI  - Trace-Based Post-Silicon Validation for VLSI Circuits
SN  - 9783319005331
PY  - 2014///
CY  - Germany
PB  - Springer
KW  - Trace-Based Post-Silicon Validation for VLSI Circuits
UR  - http://link.springer.com/book/10.1007/978-3-319-00533-1
ER  -