TY  - BOOK
AU  - Cher Ming Tan, Feifei He
TI  - Electromigration Modeling at Circuit Layout Level
SN  - 9789814451215
PY  - 2014///
CY  - Germany
PB  - Springer
KW  - Electromigration Modeling at Circuit Layout Level
UR  - http://link.springer.com/book/10.1007/978-981-4451-21-5
ER  -