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1.
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Defect Oriented Testing for Nano Metric CMOS VLSI Circuits,Ed2 by
Edition: Second
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: New Delhi Springer 2007
Availability: Items available for loan: Basaveshwar Engineering College,Bagalkote (2)Call number: 621.381042 SAC, ... Items available for reference: Basaveshwar Engineering College,Bagalkote: Not for loan (1)Call number: 621.381042 SAC.

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2.
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Germany Springer 2014
Online resources:
Availability: Items available for loan: Basaveshwar Engineering College,Bagalkote (1).

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3.
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Low-Power High-Resolution Analog to Digital Converters by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Germany Springer 2014
Online resources:
Availability: Items available for loan: Basaveshwar Engineering College,Bagalkote (1).

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Total No of Books as on Date

Titles Volumes National Journals(Print) International Journals(Print) e-Books e-Journals
43955 139001 162 3 34446 10300

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10.00am to 5.30pm Closed
Contact Information: Librarian, Basaveshwar Engineering College(Autonomus) Bagalkot -587102 Mobile:9448514872