000 00515nam a2200205Ia 4500
008 191001s9999 xx 000 0 und d
020 _a0000052478
082 _a621.381042
100 _aNicola Nicolici
245 0 _aPower Constained Testing of VLSI Circuits
260 _aBoston
_bKluwer
_c2003
536 _aTEQIP
650 _a Constained
650 _a Power
650 _a Testing
650 _a VLSI
650 _aCircuits
650 _aElectronic Devices & Circuits(621.381042)
942 _cBK
999 _c19207
_d19207