000 00527nam a2200205Ia 4500
008 191001s9999 xx 000 0 und d
020 _a0000052662
082 _a621.381958
100 _aMiron Abramovici
245 0 _aDigital Systems Testing and Testable Design
260 _aNew York
_bJohn wiely
_c1990
536 _aTEQIP
650 _a Digital
650 _a Systems
650 _a Testable
650 _a Testing
650 _aDesign
650 _aDigital Electronics principless(621.381958)
942 _cBK
999 _c19317
_d19317