| 000 | 00522nam a2200157Ia 4500 | ||
|---|---|---|---|
| 008 | 191026s9999 xx 000 0 und d | ||
| 020 | _a9781439829424 | ||
| 100 | _aGoel , Sandeep K. | ||
| 245 | 0 | _aTesting for Small-Delay Defects in Nanoscale CMOS Integrated Circuits | |
| 260 |
_aLondon _bT&F _c2014 |
||
| 536 | _aManagement | ||
| 650 | _aElectrical | ||
| 650 | _aTesting for Small-Delay Defects in Nanoscale CMOS Integrated Circuits | ||
| 856 | _uhttps://www.taylorfrancis.com/books/9781439829424 | ||
| 942 | _cE_BOOK | ||
| 999 |
_c55167 _d55167 |
||